Tohru Ogawa1,2, Manabu Himeno1 and Takayuki Hirata1
1Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305, Japan
2Institute of Mathematical Statistics, Minami-Azabu, Minato-ku, Tokyo 106, Japan
(Received January 17, 1991; Accepted March 1, 1991)
Keywords: Critical Phenomena, Fractals, Scaling, Visual Images, Ising Model
Abstract. This paper is a preliminary report of our attempt containing many fresh aspects in the aim, method and the attitude. Though the aims are multiple, our effort is directed toward to obtain an ideal critical pattern. The concept of an ideal critical pattern is not completely closed but evolves in the course of the investigation.